SHANGHAI, China – March 18, 2008 – Teradyne, Inc. (NYSE: TER) will exhibit for the eighth consecutive year at SEMICON China, showcasing the J750ExTM test system and the Nextest® Magnum EVTM. The conference, held in Shanghai on March 18-20, celebrates its 20th year dedicated to semiconductor manufacturing in China. Mark Jagiela, president, Teradyne Semiconductor Test Division will participate in the Test CEO Summit on March 19th. Teradyne currently has more than 1,600 semiconductor and board test systems installed in China.

Teradyne’s J750TM platform revolutionized ATE with its economical parallel testing and compact “tester-in-a-test-head” design. With more than 2,600 systems installed worldwide, the J750 has become one of the most successful platforms in ATE history. The J750’s new Ex instrumentation delivers even more test performance with 200 MHz/550 Mbps digital, a 24-channel high density VI, digital signal source and capture behind each pin, and 196 Gbit SCAN depth.

Demonstrations on the J750Ex include the testing of a dual site high performance and highly integrated multimedia System-on-Chip (SoC) device which highlights the improved DFT/Scan capability from the Ex instrumentation. Visitors will also see dual site testing of a quad-band cellular baseband device, including GSM and GPRS support, with MPEG4 / MP3 and JPEG encoding and decoding features, highlighting the J750Ex’s cost efficiency, mixed signal capability and compatibility with the current J750 systems. Teradyne will also showcase its Test Assistance Group (TAG) which provides a comprehensive integrated hardware solution to ensure the quality of signal delivery between DUT and ATE during the test engineering and production process.

Also at the show, Nextest, a Teradyne company, will demonstrate the Magnum EV, a self-contained, low power, low-cost engineering solution for test program development, debug, and device engineering. Visitors will see the demonstration of a flash device as well as a general overview of the system’s hardware and software capabilities.

 “Teradyne continues to show its commitment to the growing China market,” said SI Wei, vice president, Semiconductor Test Field Operations, Greater China Region.  ”Our show theme of  ‘Consistent Quality, Economical Solutions’ reinforces our focus on providing customers with accurate, repeatable measurements while addressing the cost of test needs that are so important to device manufacturers and test contractors.”  

For more information about Teradyne at SEMICON China, please visit our web site http://www.teradyne.com/semichina/index.html (English version) or http://www.teradyne.com/semichina/index_chinese.html (Chinese version).

About Teradyne
Teradyne (NYSE:TER) is a leading supplier of Automatic Test Equipment used to test complex electronics for the consumer electronics, automotive, computing, telecommunications, and aerospace and defense industries. In 2007, Teradyne had sales of $1.1 billion, and currently employs about 3,800 people worldwide. For more information, visit www.teradyne.com. Teradyne® and Nextest® are a registered trademark of Teradyne, Inc. in the U.S. and other countries. All product names are trademarks of Teradyne, Inc. (including its subsidiaries) or their respective owners.

Nextest is a Teradyne company and has shipped over 1,900 systems to more than 70 semiconductor companies worldwide. Further information is available at www.nextest.com.

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