NORTH READING, Mass. – December 1, 2009 – Teradyne (NYSE: TER) announced the introduction of a new member of its Magnum family of memory test solutions, the Magnum 2x™.  Capable of testing over 1,280 devices in parallel, the Magnum 2x delivers an unprecedented level of efficiency and low-cost for probe and package test. While designed for massive parallel test applications, the Magnum 2x achieves speeds up to 800 Mb/s for full performance testing of memory and logic devices. Teradyne has shipped multiple Magnum 2x test systems to major customers in the Pacific Rim.

“The memory market continues to progress with greater densities and higher volumes—and cost is always a top priority for our customers,” said Tim Moriarty, vice president and general manager of memory products, Teradyne. ”We are very confident that the Magnum 2x, with its extended test capacity, will reinforce Teradyne's leadership position in low-cost, volume testing.”

Based on the successful Magnum 2 architecture, the 2x continues the Teradyne legacy as the leader inlow-cost, high-throughput testing—with twice the pin count. Magnum 2x delivers the required flexibility allowing customers to choose the configuration that best fits their needs today, and in the future. System configurations start with one chassis offering up to 1,280 pins; two chassis with up to 2,560 pins; four chassis with up to 5,120; and eight chassis with up to 10,240 pins—each with the same small footprint as Magnum 2. Additionally, test engineers can run their existing Magnum 2 test programs on the 2x; resulting in significant savings of time, resources and test costs.

About Magnum 2x
The Magnum 2x provides 400MHz clocks and data rates up to 800 Mbps in SuperMux™ mode, without any loss of resources. In support of these high data rates, Magnum 2x delivers 175 ps edge accuracy and the waveform fidelity needed to support both engineering and production solutions. The Magnum 2x also promotes its extended logic capability that supports up to 256MV per-pin and independent data per-pin for flexible testing of high-speed devices.

The Magnum 2x’s Algorithmic Pattern Generator (APG) has high efficiency throughput and supports the testing of Terabyte scale memories. The Error Capture and Redundancy (ECR) analysis circuits are optimized to capture up to 5760 gigabits of error information per system, at-speed, with redundancy and fail processing in the background.

Pricing and Availability
The Magnum 2x test products are currently available and pricing is based on configuration.

About Teradyne
Teradyne (NYSE:TER) is a leading supplier of Automatic Test Equipment used to test complex electronics used in the consumer electronics, automotive, computing, telecommunications, and aerospace and defense industries. In 2008, Teradyne had sales of $1.1 billion and currently employs about 2,900 people worldwide. For more information, visit www.teradyne.com. Teradyne® is a registered trademark of Teradyne, Inc. in the U.S. and other countries. All product names are trademarks of Teradyne, Inc. (including its subsidiaries).

###

Editor’s Note: For product photography and other resources, please visit Teradyne’s press room at:   http://www.teradyne.com/pressRoom/index.html