Semiconductor Test is a lead-
ing supplier of semiconductor test equipment for logic, RF, analog,
power, mixed-signal, and memory technologies. We deliver test solutions
to developers and manufacturers of a broad range of integrated
circuits, packaged separately or integrated as System-On-a-Chip (SOC)
or System-In-Package (SIP) devices. ICs tested by Teradyne are used in
computing, communications, consumer, automotive, identification, and
internet applications.
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Home > SEMICON China 2009
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欢迎光临泰瑞达在中国半导体设备与材料展会上的展览
Join Teradyne at SEMICON China
2009年3月17日至19日
March 17-19, 2009
W2馆2643号展位
Hall W2, Booth # 2643
地点：上海新国际博览中心
Shanghai New International Expo Center – SNIEC
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在本届中国半导体设备与材料展会上，泰瑞达将展出自动测试设备领域的首次最广泛的半导体测试产品系列。
瑞达带领它的Eagle测试和Nextest业务部门， 将演示领先的全系列测试解决方案，包括UltraFLEX™, Magnum, ETS-88 and ETS-200T/FT.
ATE’s broadest set of semiconductor test products will be on display for the first time in the Teradyne Booth at SEMICON China 2009. Teradyne, along with its Eagle Test and Nextest Business Units, will demonstrate leading test solutions including the UltraFLEX™, Magnum, ETS-88 and ETS-200T/FT.
欢迎您亲临参观和了解泰瑞达如何在广阔的半导体器件领域里， 提供低成本量产和优质性能的测试方案！
Find out for yourself how Teradyne reliably delivers performance and throughput with low cost of test for the broad range of semiconductor devices.
For more information, visit http://semiconchina.semi.org. |
The UltraFLEX™ test system delivers the power and precision needed for testing advanced microprocessors, PC chipsets and graphics, disk drives, video game devices, System-On-a-Chip (SOC) or System-in-Package (SIP), memory, baseband digital, network and broadband devices. The UltraFLEX offers a wide range of coverage when the device mix and throughput goals demand the highest speed, precision, coverage and capacity for unprecedented multisite test efficiency. |
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Nextest delivers an economical and efficient test solution for flash memory test. The Magnum EV provides a self-contained, low power, engineering test solution designed for engineering desktop applications that demand a test program development and debug station that is fully compatible with Magnum production systems. Through Magnum’s flexible architecture, systems can be configured from 128 up to 7680 pins for massively parallel test applications, providing flash device manufacturers an economic test solution for high-volume production. |
Designed for high-volume commodity and precision device testing, the Eagle Test ETS-88 can simultaneously run multiple unrelated test applications using multiple handlers and/or probers. The system utilizes the same pattern-based floating resources and Eagle VisionTM software that customers expect from an Eagle platform.
This new breed of high-performance multisite production test equipment focuses on analog and mixed-signal devices such as: LDOs, PWMs, Battery Chargers, Hot Swap Controllers, Gate Drivers, Power Switches, OPAMPs, and Audio Amps including Class D, Video Amps, etc. The system achieves high- parallel test efficiency through the use of four independent testers in one small footprint. |
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The Eagle Test ETS-200T/FT (Final Test) is designed for testing discrete devices, particularly for Power MOSFET products running on rotary/turret handlers or other index-parallel type handlers. The ETS200T/FT uses Eagle’s proven index-parallel architecture to provide FET testing solutions for up to four standard test stations covering both DC and AC test parameters. Two optional test stations (dVSD ad UIL) are also available. Raptor-FT software, a GUI-based test program developer, allows customers to develop discrete applications quickly and provides optimization tools to help maintain fast test times while having accurate and repeatable measurements. |
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