Key Features:

• Takes into account the strengths of each available test and inspection technique utilizing XML-based part libraries
  
  
• Provides best-in-class analysis solutions for boards with limited access
  
  
• Performs Design For Test (DFT) and test coverage analysis against predicted fault spectrum
  
  
• Optimizes for either complementary or redundant fault coverage
  
  
• Supports both Teradyne and non-Teradyne test and inspection equipment
  
  
• Model multiple user-defined test and inspection sequences, including:
    • FPT --> ICT
    • ICT --> 3D AXI
    • AOI --> 2D AXI --> ICT
    • 2D AXI --> ICT