Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-
ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

Product Integration

Test Floor Automation

Test Floor automation is quickly becoming a requirement among the semiconductor test industry.  One of the main reasons for factory automation is to allow a central and/or remote location to control the equipment on the test floor.  Another reason is to provide a standard requirement to which all equipment must meet, which allows the equipment to integrate seamlessly. 

Test Floor automation, in the ATE context, applies to the test cell.  A test cell is comprised of a cell controller (host), tester (equipment), and either a handler or prober (equipment). Automation is where a cell controller remotely controls the operation of the test cell.  Control of the test cell can be loading and running the test programs, requesting the test results from the tester, monitoring the testing process, monitoring the equipment activity, and other operations.  Automation reduces human interaction and therefore reduces chances for mistakes or missed steps in the testing process.

The Teradyne SECS/GEM interface allows for remote control of the Tester. Features found in the IMAGE and IG-XL SECS/GEM software include:

  • Implementation of the SECS-II, HSMS, GEM, and TSEM network protocols as defined by the relevant SEMI standards.
  • Acceptance, validation, and execution of the Remote commands defined in the TSEM standard.
  • External indication of the Tester's state via:
  • "Variables" and "Reports" that can be read from the Host upon command, and
  • Events (including "Reports" and "Alarms") that can be asynchronously issued to the Host by the Tester.  These events are known as “Collection Events” or “Collected Events”.
  • Communication between the Host and the human Tester operator via a simulated terminal interface.
  • Operator Control that allows the enabling and disabling of the entire remote control scheme.