Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-
ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

Product Integration

Handler Inserts

A Handler Interface consists of the necessary material to allow a Teradyne tester to be connected mechanically to the final test handler.  This includes a base plate and an insert, as well as a registration kit (one registration kit required per site).

The base plates have a standardized cutout in the center to allow the interface to be adapted to a number of different configurations.  Teradyne offers inserts to allow docking to Catalyst as well as the FLEX family without the need to swap out the complete interface.  The inserts for the interface are purchased a-la-carte to allow the interface to be customized for the specific needs of the application.  The FLEX family inserts are listed below.

Quick DIB Clamp - QDC

The QDC offered an exciting new step in interfacing when released in 2000.  The patented design provides a low profile means of easily locking the Interface Board to the peripheral overcoming previous design restrictions by the industry standard cam rings.  It was the standard solution offered on both prober and handler interfaces (until the HIB Changer was announced in 2004) because of its flexibility and power capacity.  

It consists of a plate with two QDC blocks connected by a single handle that gives a great mechanical advantage to the operator allowing even the smallest of operators to latch boards to the peripherals (probers included) with ease.

The QDC requires that the HIB (or PIB) stiffeners be equipped with the QDC handles.  The QDC handles for Tiger/FLEX/MicroFLEX are different part numbers than those for the UltraFLEX stiffeners.

HIB Changer

Just announced in 2004, the HIB Changer is Test Cell Business Unit's latest interface option that provides unprecedented ease when changing a Handler Interface Board for DUT Up handlers.

A typical process for changing the HIB in DUT Up Handlers (such as the Delta Edge and Seiko Epson NS6040) prior to the HIB changer was to undock the tester, roll the handler away for access to the HIB, unscrew the HIB/Socket from the handler to replace the HIB and then round up 3 test floor employees to push the handler back into position and align it back to the tester.  

The HIB changer operates much like a CD tray in a stereo system.  The operator needs to simply undock and press the Unlatch button on the HIB changer.  A pneumatic system unlocks and lowers the HIB just enough that the tray can be pulled out and the HIB serviced or a new HIB installed.  The handler no longer needs to be relocated for access.

HIB Changer Stiffener brackets are required to use the HIB changer.  These brackets are selected based upon HIB thickness - also, the brackets for the Tiger/FLEX/MicroFLEX stiffeners are different part numbers than those for the UltraFLEX stiffeners.

An enhanced HIB Changer solution will also soon be available for Side dock DUT Up handlers as well.

 

Basic

The Basic insert provides an economical option that provides a simple tool less fastener type design that will secure the HIB to the interface using knurled thumbscrews.  

Basic Insert Stiffener brackets are required to use the Basic insert.  These brackets are selected based upon HIB thickness - also, the brackets for the Tiger/FLEX/MicroFLEX stiffeners are different part numbers than those for the UltraFLEX stiffeners.

 

For more information, please contact your local sales representative.