Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

Tiger
Advanced Analog Integrated System Technology
  • Instrument noise floor at –150dBfs/Hz
  • Dual data bank architecture for continuous testing with background data processing
  • Analog instruments synchronized to digital and test pattern
  • Up to 20 analog instruments per system

A full range of advanced analog instrumentation (including audio, baseband, DSL, video, VHF, microwave, and time measurement) provides the lowest noise floor available on any test platform. All instruments feature dual data bank architecture so testing continues while data from the previous capture is moved to the background for DSP processing.

Analog instruments are synchronized with both Tiger digital instruments and the test pattern, improving test results, test confidence, and yield. Because the Tiger system has on-the-fly edge placement at maximum tester speed, clocks and phase can be controlled to fractions of a nanosecond. With complete synchronization of all analog and digital data, every test works exactly the same way every time, from device to device and machine to machine.

Instrumentation includes:

GigaDig provides the ideal fully integrated, 9-GHz digitizer solution for all multi-gigabit transmitter testing in production.

BBAC™ broadband test instrument delivers source and capture of audio signals across the 15 MHz bandwidth, with the lowest noise density in broadband test.

High-frequency PicoClock™ instrument delivers extremely low jitter, required by today’s networking processors.

SOC Architecture >