Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications. |
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µWAVE6000 - Scaleable Solid State Wireless Test
Teradyne’s µWAVE6000 provides fully integrated, solid state RF test with high dynamic range, accuracy, and linearity, with the precision of bench top instrumentation in a production test system. Teradyne delivered the production test solutions for the first wireless telephones. Today we provide testing for more makers of Wireless LAN and Bluetooth™ technology than all other ATE companies combined. Scaleable and flexible, µWAVE6000 can be configured cost effectively to address a wide range of test requirements, ranging from highly focused RF applications to comprehensive wireless SOC test. Fully integrated and synchronized within the Catalyst Family test environment. µWAVE6000 provides a complete mixed-signal microwave test solution, with full characterization available on the same test platform used for high-volume production. Solid-state RF switching and pipelined measurement processing enables the fastest wireless test time, with high accuracy and repeatability. Modulation, signal captures, and frequency hopping are all synchronized to the digital subsystem, with settling time of less than 2 milliseconds for frequency and amplitude switching, and frequency hopping in 100 microseconds, so devices can be tested the way they really work. µWAVE6000 Instrumentation Suite
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