GigaDig is a fully integrated ATE digitizer with ultra-high bandwidth to 9 GHz, permitting characterization testing with high throughput for 1 to 10 Gbps SerDes and other high data rate devices. GigaDig provides testing for the most advanced devices to specification in production, without compromising testing or throughput.

GigaDig permits testing of all critical device parameters including:

• Rise time, fall time, and pulse width measurements (~35 ps rise time measurements)
• Full eye diagram and eye mask testing
• Separate and measure random and deterministic jitter
• Bit Error Rate Testing (BERT)

GigaDig can perform all these measurements in a single capture, typically in less than half a second. This makes it practical to do full characterization-type testing in production, guaranteeing that every device meets performance specifications.

GigaDig

• 9 GHz Bandwidth
• 2 differential inputs per instrument
• Measure 35 ps rise times to verify & characterize transmitter performance
• Full eye diagram for template testing, with no “fast eye” compromise
• Dj and Rj separation and measurement
• 1 Megasample capture memory