Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications. |
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PicoClock Module- Ultra Low Jitter Clock Source
Clocks that drive high-performance converters, modems, and data communications circuits must operate at both high frequency and low jitter. Otherwise, clock noise can affect test results or adversely impact test time. The PicoClock module provides a 5 MHz to 1 GHz, 1.5 ps rms, ultra-low wideband jitter clock output. It can accept a reference input form any digital channel or analog source instrument, and when driven by an analog instrument or second pattern generator, can run asynchronously to the system clock or instrument pattern generator. Reference input can range from 5 to 600 MHz, and is typically acquired in less than 500 microseconds. The <1.5 ps jitter of the PicoClock provides the low jitter clock source needed to test high performance converters and communications ICs in a production environment, improving test accuracy and device yields. PicoClock Module:
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