Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

Tiger
Options: SerDes Port Qualifier - High Speed Serial Test

Teradyne's SerDes Port Qualifier (SPQ) option on Tiger provides complete coverage for both device characterization and production test. SPQ offers complete testing of 3.2 Gbps SerDes ports, including at speed functional and jitter testing – separate deterministic and random, as well as jitter tolerance/transfer testing.

At multi-gigabit data rates, jitter is a critical measure of device performance. Many standards call for separate measurements of random and deterministic jitter. While other ATE solutions use separate 3rd party bench top instruments to make the measurement, the SPQ integrates the capability into the Tiger test head for optimal signal delivery, throughput, and test economics.

SPQ Test List:

  • Functional test
  • PRBS patterns
  • Jitter compliance
  • Jitter tolerance
  • Jitter transfer
  • Receiver sensitivity
  • Asynchronous port test capability
  • DC parametrics
  • Scan Test