Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications. |
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Option: Source Synchronous Pin Electronics (SSPE)
Gigaspeed Testing for Next Generation High-Speed Data Ports
The Source Synchronous Pin Electronics on the Tiger test system delivers comprehensive functional test, at speed, for the industry's newest source synchronous parallel differential buses. Testing these differential source-synchronous and serial buses requires new solutions to guarantee performance and accuracy in production. HyperTransport, RapidIO, and PCI Express exemplify these new test challenges. Tiger SSPE is the most accurate solution. The new SSPE instrument on Tiger delivers a unique advantage to the high speed bus market. It's the only system available today for accurate, efficient production testing, at speed, up to 3.2 Gbps. With SSPE, Tiger's digital speed doubles and channel count increases relative to the system's 1.6 Gbps Differential Pin Electronics (DPE32). The Tiger SSPE's unique feature set achieves the best quality, yield, and overall test economics:
For more information about Teradyne's new Tiger SSPE instrument, click here.
In benchmark evaluations, Tiger with SSPE achieves wider data eyes, improving test quality and enabling higher yield and lower cost.
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