Multi-site index Parallel (MSIP) testing in Automatic Test Equipment (ATE) significantly enhances Units Per Hour (UPH) compared to conventional multi-site testing methods. MSIP allows multiple devices to be tested simultaneously across various test sites, optimizing instrument utilization and reducing idle times. Unlike traditional multi-site testing, which often suffers from sequential processing bottlenecks and inefficient parallelism, MSIP maximizes throughput by leveraging concurrent execution. This method reduces overall test time and enhances efficiency, directly translating to increased UPH. Additionally, MSIP’s ability to balance workload dynamically across test sites ensures consistent performance and mitigates the impact of prolonged test time affected by scan and low current leakage testing times. Consequently, MSIP in ATE represents a superior approach for high-volume semiconductor manufacturing, delivering substantial improvements in productivity and cost efficiency.