Semiconductor Wafer Test (SW Test) will be holding their first annual Asia conference in Hsinchu, Taiwan October 18-19, 2018. This probe technology forum brings attendees together to learn about recent developments in the industry, network and exchange ideas. SW Test is the leading probe card technology workshop for the ATE industry.

Teradyne is a Corporate Platinum Sponsor and Exhibitor at the conference. Come visit us in Booth #204 to receive more information about the products and services we offer.