Industry Standard Solution for Complex Linear, Power and Automotive Devices
The FLEX test systems deliver cost-efficient multisite production test for devices operating under 200 MHz digital speed. Choose microFLEX or FLEX for testing mid-range devices for power management, automotive, audio and video. With microFLEX and FLEX, you optimize capital investment while achieving superior performance and throughput.
Cost-efficient test up to 200MHz: ideal for analog, digital and mixed-signal System-on-a-Chip (SoC) and System-in-Package (SiP) device testing applications
Broad range of instruments: choose from a comprehensive suite of analog and digital instrument boards to configure your test solutions
Sync-Link™ Technology: instruments take full advantage of the FLEX architecture’s Sync-Link Technology for testing in multiple time domains, precise waveform phase matching, fast microcode-level instrument set-up and control and full Background DSP with dedicated DSP computers. The combination of instrument capability and system architecture delivers the highest possible single site throughput and unsurpassed parallel test efficiency
Configuration flexibility for high site-count parallel test: microFLEX’s 12 universal slots and FLEX’s 24 universal slots accommodate a range of instruments and can easily be reconfigured for different test strategies.
Instrument and DIB compatibility: instruments and device interface boards (DIBs) used with microFLEX and FLEX test systems are interchangeable
High-Performance Mixed Signal Devices
- Power management
- Hard disk drive controllers
- Military / Aerospace
Low-Cost Mixed Signal Devices
- Industrial / medical instruments and systems
- FPGA/programmable logic
- Standard logic
Low-Cost Analog Devices
- Switching controllers and regulators
- Battery management
- Linear regulators
- Analog switch and multiplexers
- Motor drivers
- Voltage references
- 24 configurable universal slots
- Up to 1152 digital pins
- Up to 8 DSP modules
- Separate mainframe cabinet includes:
- Power distribution unit
- 19” rack space for mounting additional instrumentation
- Integrated manipulator
- 12 configurable universal slots
- Up to 576 digital pins
- Up to 4 DSP modules
- Small footprint
FLEX family AC instrumentation provides source and capture test capability with arbitrary waveform generation (AWG) and digitizing to meet escalating test requirements for SiP, SoC and high performance devices with the lowest cost of test.
FLEX family DC instrumentation provides precision voltage/current (V/I) source and measure test capability for a wide variety of SoC devices. The integrated instruments source and measure voltage and current in four quadrant operation.
DC Device Power Instrumentation
FLEX family Device Power Supply (DPS) instrumentation provides precision voltage source and current measurement test capability across a wide variety of devices. Instruments can force voltage and measure current in single or dual quadrant operation, and sources can be merged to reach higher current levels.
FLEX family digital instrumentation provides broad functionality and flexible test capability to meet the demands of evolving device performance and test methodologies at the lowest cost of test.
As the leading provider of complete Test Cell Solutions and services, we at Teradyne leverage our expertise, experience, and technology leadership to help our customers achieve the highest yield and the highest throughput in production with the fastest time to market. We partner with you in your journey from design to production to provide standard and customized test cell products and services.