LEMSYS SLIC-AC Platform
Test the switching characteristics of slow-SiC MOSFET
Measuring techniques for power electronics are key to optimizing the utilization of electrical energy. LEMSYS SLIC-AC systems provide high accuracy, performant and cost effective test and measurement for short-circuits, testing up to 3000A and 1500V with 11kA.
Advantages
Powerful bank of processors for running the most advanced image test algorithms for high resolution devices
High speed parallel data transfer at 40Gbps per instrument
Up to 80 sites in parallel test
Scalable computing and high data movement architecture ensure the lowest cost of test across all sensor types – from low site count specialty sensors to high volume image sensors
Secure and easy support for customer proprietary test algorithms
Configurations
IP750Ex-HD
- 80-site system capable for wafer test
- ICMD 1.5Gbps MIPI D-Phy image capture instrument
- Custom LVDS capture capability with ICMD
- D-PHY 2.5Gbps image capture unit
- C-PHY 2.5Gsps image capture unit
- M-PHY 6.0Gbps image capture unit
- HSD800 400MHz Digital instrument
- HDDPS 24/48Ch DC source
- 40Gbps image data transfer
- 150mm x 160mm illuminator support
- Compatible with J750Ex-HD instruments
System Options
VI Resources
- APMU: 64Ch, -35V to 35V, 50mA@35V capability, merge x8 /400mA
- HDVIS: -10V to 10V, 200mA@10V capability, merge x4/800mA
Converter Test
- CTO: 8 Source, 8 Capture, 16-bit ADC testing
- HDCTO: 32 Source, 32 Voltage Reference, 8 Capture, 14-bit ADC testing