Expand All
  • High Pin Count TTL/LVTTL/LVDS with FPGA Configurability and VPC Funnel

    eDigital-6020A_200x211.pngBest choice when current or future requirements include: 

    • High pin count TTL/LVTTL capability
    • High throughput IEEE 1149.1 test and memory programming
    • Conventional stored pattern capability
    • FPGA configurability to address a variety of low-level bus specifications


  • Technical Description
    • Integrated Instrument and Virginia Panel Funnel Interface
      • Single-piece instrument and funnel assembly with QuadraPaddle interface module
      • Supports both i2 MX cables and G20 ITAs
      • 3.3V LVTTL is TTL-Tolerant and compatible
      • Supports up to 64 LVTTL I/O pins, or 32 LVDS differential pairs
    • Broad IEEE 1149.1 Boundary Scan support
      • Supported by the runtime software from the major third-party vendors
      • Conventional interconnect tests through large-capacity Flash programming
      • Multiple Test Access Ports and large pin count parallel I/O
      • Serial Vector Format (SVF) runtime capability (HSSub App included in TriFlex software)
    • Teradyne eDigital HSSub App provides conventional stored pattern (truth table) testing (included in HSSub TriFlex software)
    • Flexible low-level HSSub Tier 1 I/O Bus Processing
      • Reconfigurable HSSub Tier 1 (I/O Bus Processing) of the HSSub Three Tier Architecture implemented by a large Test Defined FPGA and local memory
      • Configured in seconds by HSSub Apps supported by Teradyne, end-users, and third-party developers
      • HSSub App development, if required, is simplified by FPGA template code based on standard design patterns
      • HSSub TriFlex Infrastructure Software interfaces provide access to the hardware from Windows Tier 3 or HSSub Tier 2 instruments
  • Key Attributes