As the need for 5G and other mmWave testing increases so does the need for efficient device interface board (DIB) de-embedding. Multi-channel, multi-site DIBs have a multitude of paths which need to be de-embedded individually. PCB manufacturing variations can cause each path’s performance to vary significantly, including etching, stack-up dimensions, dielectric variations, and performance variations of individual IC’s. As wavelengths decrease, the described manufacturing variations have an increasing effect on insertion loss and impedance matching, which leads to yield fallout. The typical manual de-embedding process, in which the user disconnects and reconnects cables for each path, becomes increasingly time-consuming and error-prone. Enter the mmWave DIB de-embedding station. A custom-designed GUI controls an integrated UR5e robot, Keysight PNA, power supplies, and logic controllers. This station automates the DIB de-embedding measurements of each complete physical path, from the blindmate tester interface through to the DUT socket pogo pin. This presentation will demonstrate the Automated De-embedding Station including: defining the DIB paths, initial setup, data validation, and generation of two port de-embedding S-parameter files for incorporation into an IG-XL test program.