In the IP750 tester, there is a need for a wide illumination area to test large image sensor dies with higher site count coverage. To satisfy this need, Teradyne had developed twin direct docking, which rotates the test head together with the illuminator and LBox . Our newest docking solution for the IP-750ExHD provides a wider illumination area and can be better adapted to multi-site image sensor testing. In this presentation, we will explain the benefits of the rear-shift docking compared to the existing docking solution, and best practices for how to integrate the test head and the prober to maintain signal integrity.