As wireless frequencies get higher, the trace from test instrument to DUT cannot be ignored. Complicated RF testing fixtures, like RF cables, DIB traces, DIB components and socket needles, have made it hard to get accurate test results, making data correlation, including site to site correlation, EVB to ATE data correlation, and DIB to DIB correlation, complex and difficult. These types of issues result in low yield and repetitive work during production. This presentation will introduce an RF calibration solution for common RF devices, including a calibration procedure and calibration tool. The calibration procedure introduces the pathloss model and explains how to get an accurate pathloss value. We’ll discuss system errors in different scenarios and how to manage them, and introduce a tool to help with RF calibrations in both the lab and production environment.