PAM-4 signaling is being standardized for GDDR7 and a near-term application solution to test GDDR7 devices is needed for Teradyne’s Magnum-EPIC tester with multiplexed NRZ signaling, until a native PAM-4 feature is available in Teradyne’s next generation tester. The biggest change in the transition from NRZ signaling to PAM4 is the availability of three eye diagrams instead of one, and the need to be aware of the relative positions and shapes of all three eyes – upper, middle, and lower. This presentation details a proof-of-concept DSA solution that includes scope jacks, loopbacks and AWG inputs to the tester channels with various lengths of traces. We will review techniques applied to program 4 PAM-4 symbols and API suggestions for the symbol programming method of 4 different drive levels, with supporting scope waveform data at various Baud rates. We will also cover the challenges to test three different levels of the PAM-4 output eyes and propose a solution for how to judge test results with loopback eye shmoo data. Lastly we will discuss other challenges with this solution at a higher data rate, 7G Baud for example, and enhancement ideas for better performance and improved productivity.