In general, memory test equipment uses ALPG to create and use repetitive and sequential addresses, with predictable and arithmetic values also used for the data put into the address. Instead of sequential or repetitive addresses, users access random addresses, and often, they write or read random data. Therefore, information about defects is primarily provided in the form of a random vector rather than a traditional memory test pattern. If vector memory is supported by the memory tester, the provided random vector type of failed information is tested by implementing the random failed information as it is. However, Magnum EPIC testers only support subroutine memory. This presentation will detail how to perform a limited vector test using subroutine memory on a Magnum EPIC tester without vector memory. We will discuss the tester’s resource allocation in the process of converting a general vector to subroutine memory and points to be aware of, and an example of actual GDDR6 device testing.