This Q&A panel session provides an opportunity for attendees to ask questions related to the following presentations covering Big Digital Device Challenges:
- Keeping Devices Cool
- Saving Vector Memory on the UP2200 with Functional Vector Compression
- Improving Multi-site Efficiency with Independent Patterns per Site
- MPD Bus/Interface Characterization With or Without Source-Synchronous Hardware on UltraFLEX
- Using TestInsight to Convert High Speed Scan STIL to UltraFLEX/UltraFLEXplus Patterns
- Current Profiling: In a Class of Its Own
- Understanding the Test Challenges of SCAN Using 1149.10 and How UltraPin2200 Solves Them
- Using a DUT’s HSIO Interfaces in a Fully-Functional Protocol Configuration for SCAN Test