Cres testing guarantees good device contact for high current pins in Smart Power Stage applications. Experience shows good contact is critically important for robust production-worthy test solutions and depending on the methodology, Cres testing can be burdensomely slow. This presentation will discuss two technique improvements to achieve <5mS per test Cres testing with mOhm level accuracy, including loop Cres testing, which utilizes existing high current test setups and connects SPU sense lines on the PCB in such a way that two Cres tests are made simultaneously; and group Cres testing, which operates by utilizing multiple resources connected to the same high current DUT pads, allowing multiple resources to be connected in such a way to measure 4 Cres values in series in the same “group”.