With the rapid growth of the GaN market, customers need more efficient wafer sort test solutions. This presentation will introduce a 16-site wafer sort solution for the ETS-88 system, including TIB, PIB and 16 customizable relay modules, which allows users to define the test flow to meet specific test requirements. With the upgraded tester configuration, the solution can reach a 1000V/12A test specification and can cover most of the GaN test requirements for wafer sort. Additionally, we will discuss the high voltage protection circuitry in the solution to protect the instrument from damage when a shortage occurs to one or more sites during high voltage testing, which also helps improve parallel test efficiency.