This Q&A panel session provides an opportunity for attendees to ask questions related to the following presentations covering Power Discrete Test:
- Introduction to a 16-Site GaN Wafer Sort Solution for ETS-88
- The Basics of the HV Probe Code Library
- A Scalable Multi-site Discrete Wafer Test Solution
- High Current Pulsed DC Testing Up to 4 KA with the HCU2000
- GaN Power Transistor Test Solution and Dynamic RDSon Test
- HCU2000 Best Practices: How to Program for the Best Performance and TTR
- Different PDS Structures for Parsing Parameters on the ETS-88