As test complexity grows, indications are that the cost of consumables (probe cards and DIBs) is increasing faster than other major categories of ATE and material handling. It has been more than ten years since there was an in-depth analysis of the factors driving these costs. In that time the technology for interface, probe needles, and mechanical integration has changed significantly and the “rules of thumb” on how to manage interface hardware need to be updated. This presentation will discuss an updated cost of ownership model and take a fresh look at the cost drivers that dominate consumable spend today, including an outlook for the next 8-10 years. We’ll also discuss the solutions that Teradyne has developed to achieve the lowest cost of ownership.