Digital Signal Source and Capture (DSSC) is a powerful feature on the ETS-800’s HSD-32 instrument. It enables the reallocation of digital pattern memory while the test application is running. The ability to change digital pattern memory “on-the-fly” accommodates the dynamic memory needs of complex devices. This presentation will discuss a brief overview of the feature and then delve into the test time implications for different modes of operation, including read and write capability in both parallel and serial modes. We will review multiple use cases and the corresponding DSSC settings to achieve the fastest test time.