Concurrent test is a method which is significant to reduce test time. UltraFLEXplus supports most of the concurrent test features found on the UltraFLEX. Additionally, UltraPin2200 improves patgen and PA engine granularity. DC instruments can individually be assigned to different time domains on UltraFLEXplus. These advantages make concurrent test easier on UltraFLEXplus platform. Modern devices designed with numerous independent blocks on the same die or in the same package are perfectly compatible with concurrent test features. This practice is an AIOT device which contains PMIC, analog, RF, USB, PLL blocks. Meanwhile, AIOT device is extremely sensitive to the cost. Depend on this, this paper will discuss preconditions for applying concurrent test to a project on UltraFLEXplus, basic mechanism of concurrent test and how to apply concurrent test to a project, concurrent test benefits on test time reduction based on our practical verification project. We have tested the performance of concurrent test by assembling four different block combinations in this practical project which covers the concurrency between pattern, protocol aware and DC instrument. This paper will also illustrate the efficiency, HW design requirement and potential concurrent test advice for device designers based on our best practice.