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Teradyne Users Group

TUGx Global Seminars are a series of one day, free events held throughout the world both in-person and virtually. These local seminars provide an avenue for Teradyne to share best practices and new test methodologies, ensuring content is relevant to the local audience and empowering our customers to get the most out of their Teradyne technology.

Welcome to TUGx 2022

We are excited to welcome you back to TUGx this fall, both in-person and virtually, with a change to our virtual event format.

In-person: Join us for in-person local TUGx events held in ten regions around the world. After your in-person event is over we’ll send you the details to access the virtual event and attend the virtual live Roadmap and Q&A sessions. Read on for a full explanation of the virtual event.

Virtual: This year, except in Japan, our virtual events will have a different format. Register to attend virtually and gain access to more than 90 presentation recordings, which you will be able to watch at your leisure beginning October 1. Then join us for one of our Live Virtual Sessions, which will include the popular Teradyne Roadmap presentation and topical Q&A’s live with Teradyne authors. Three Live Virtual Sessions will be held at different times to accommodate times zones around the globe

Please note: Our Japan event will utilize the same virtual format as last year and include virtual live presentations held on specific days and times.

We look forward to seeing you at TUGx.

Locations & Details

Times shown are local times
Abstracts
Region
Event Type

Korea | Seoul

In PersonOctober 20, 2022 | Advanced Digital Track
9:00 am
Registration
9:30 am
Welcome
9:45 am
Teradyne Roadmap Presentation
11:00 am
Break
11:15 am
Improving Multi-site Efficiency with Independent Patterns per Site
11:45 am
A Solution for 93K to UltraFLEXplus Program Conversion
12:15 pm
Lunch
1:30 pm
Keeping Devices Cool
2:00 pm
Alarms Reporting, Processing and Debugging on UltraFLEXplus
2:30 pm
Break
2:45 pm
Using TestInsight to Convert High Speed Scan STIL to UltraFLEX/UltraFLEXplus Patterns
3:15 pm
Code is Code and an IDE is Just a Fancy Text Editor, Right? Not Quite …
3:45 pm
Break
4:00 pm
Q&A
4:30 pm
Closing
In PersonOctober 20, 2022 | RF/mmWave and Memory Track
9:00 am
Registration
9:30 am
Welcome
9:45 am
Teradyne Roadmap Presentation
11:00 am
Break
11:15 am
Application PAM-4 Test Solution for GDDR7
11:45 am
Application Vector Test Solution for GDDR6
12:15 pm
Lunch
1:30 pm
An UltraLow Phase Noise Square Wave Reference Clock Above the UltraWave24 DUT Clock Maximum Frequency on the UltraFLEX
2:00 pm
An Overview of RF Evaluation Software Tools
2:30 pm
Break
2:45 pm
Optimized Measurements for RF Functional Verification of 5G and mmWave Devices Using Signal Processing Techniques
3:15 pm
An Automated Station for Efficient, Repeatable mmWave DIB De-embedding
3:45 pm
Break
4:00 pm
Q&A
4:30 pm
Closing
In PersonOctober 20, 2022 | Power & Module and System Level Test Track
9:00 am
Registration
9:30 am
Welcome
9:45 am
Teradyne Roadmap Presentation
11:00 am
Break
11:15 am
Inline Slot Recovery for Titan
11:45 am
A Scalable Multi-site Discrete Wafer Test Solution
12:15 pm
Lunch
1:30 pm
GaN Power Transistor Test Solution and Dynamic RDSon Test
2:00 pm
High Current Pulsed DC Testing Up to 4 KA with the HCU2000
2:30 pm
Break
2:45 pm
Power Management: Protecting Today’s Sensitive DUTs
3:15 pm
MIPI I3C: an Introduction to Testing the Evolution of the I2C Bus Standard
3:45 pm
Break
4:00 pm
Q&A
4:30 pm
Closing

US | Plano/Dallas TX

In PersonOctober 10, 2022 | IG-XL Track
8:00 am
Registration
9:00 am
Welcome
9:15 am
Teradyne Roadmap Presentation
9:45 am
Probe Cards and DIBs in the Era of Complexity: A Fresh Look at Total Cost of Ownership
10:30 am
Break
10:45 am
Addressing Issues and Submitting Problem Cases
11:15 am
Next Generation Smart Power Unit: The SPU8112
11:45 am
Lunch
1:00 pm
Introducing Repeatable Code Sequences on the UltraFLEXplus
1:30 pm
Alarms Reporting, Processing and Debugging on UltraFLEXplus
2:00 pm
Code is Code and an IDE is Just a Fancy Text Editor, Right? Not Quite …
2:30 pm
Efficient Jitter Measurements of Low Frequency Asynchronous Clock Outputs on the UltraFLEX Family
3:00 pm
Break
3:15 pm
Keeping Devices Cool
3:45 pm
Plot Tool Deep Dive
4:15 pm
Fast Throughput on the UltraFLEXplus Enabled by the PACE Architecture and Site-Aware Variables
4:45 pm
Improving Multi-site Efficiency with Independent Patterns per Site
In PersonOctober 10, 2022 | ETS Track
8:00 am
Registration
9:00 am
Welcome
9:15 am
Teradyne Roadmap Presentation
9:45 am
Probe Cards and DIBs in the Era of Complexity: A Fresh Look at Total Cost of Ownership
10:30 am
Break
10:45 am
Addressing Issues and Submitting Problem Cases
11:15 am
Next Generation Smart Power Unit: The SPU8112
11:45 am
Lunch
1:00 pm
Test Time Reduction Using UPD64 High Speed Capture on the ETS-800
1:30 pm
ETS-800 QMS Measurement Accuracy Improvement for BMS & POL Applications
2:00 pm
Test Time Analysis of DSSC on the ETS-800
2:30 pm
Teradyne Productivity Tools for EV-MST
3:00 pm
Break
3:15 pm
MST Test Program Skeleton Generator: A Shortcut for Test Program Development
3:45 pm
ETS-800 Test Program Checking Tools Overview
4:15 pm
Audio Test Solutions for ETS-800
4:45 pm
Spike Check Automation Tool for Automating the Oscilloscope and ATE Operation

US | North Reading MA

In PersonOctober 13, 2022 | UltraFLEX & Wireless Track
8:30 am
Registration
9:00 am
Welcome
9:15 am
Teradyne Roadmap Presentation
10:00 am
Break
10:15 am
Examining mmWave Structures using Time Domain Reflectometry
10:45 am
An Automated Station for Efficient, Repeatable mmWave DIB De-embedding
11:15 am
An RF Calibration Method for RF Devices in Production
11:45 am
Testing mmWave Transceivers
12:15 pm
Lunch
1:15 pm
Test Development Nirvana: Utilizing Design Files with PortBridge
1:45 pm
The Impact of IG-Sim on Efficient Program Development
2:15 pm
Current Profiling: In a Class of Its Own
2:45 pm
Break
3:00 pm
Fast Throughput on the UltraFLEXplus Enabled by the PACE Architecture and Site-Aware Variables
3:30 pm
Code is Code and an IDE is Just a Fancy Text Editor, Right? Not Quite …
4:00 pm
Using a DUT's HSIO Interfaces in a Fully-Functional Protocol Configuration for SCAN Test
4:30 pm
Networking Event
In PersonOctober 13, 2022 | ETS & Tools Track
8:30 am
Registration
9:00 am
Welcome
9:15 am
Teradyne Roadmap Presentation
10:00 am
Break
10:15 am
HCU2000 Best Practices: How to Program for the Best Performance and TTR
10:45 am
Site-Aware DIB Identification
11:15 am
12 Cell BMS Test Solution for the ETS88
11:45 am
Teradyne Productivity Tools for EV-MST
12:15 pm
Lunch
1:15 pm
ETS-800 QMS Measurement Accuracy Improvement for BMS & POL Applications
1:45 pm
Test Time Analysis of DSSC on the ETS-800
2:15 pm
Test Time Reduction Using UPD64 High Speed Capture on the ETS-800
2:45 pm
Break
3:00 pm
Power Management: Protecting Today’s Sensitive DUTs
3:30 pm
A Scalable Multi-site Discrete Wafer Test Solution
4:00 pm
An Introduction to Teradyne's DIB Diagnostic Tools
4:30 pm
Networking Event

US | San Jose CA

In PersonOctober 24, 2022 | UltraFLEX & ETS Track
8:30 am
Registration
9:15 am
Welcome
9:30 am
Teradyne Roadmap Presentation
10:30 am
Break
10:45 am
Asynchronous Parallel Test with SLT
11:15 am
Fast Throughput on the UltraFLEXplus Enabled by the PACE Architecture and Site-Aware Variables
11:45 am
Lunch
1:15 pm
The Impact of IG-Sim on Efficient Program Development
1:45 pm
112Gbps PAM4 and NRZ PHY Layer Testing Using Third Party Instruments
2:15 pm
Break
2:30 pm
ETS-800 QMS Measurement Accuracy Improvement for BMS & POL Applications
3:00 pm
Teradyne Productivity Tools for EV-MST
3:30 pm
Test Time Reduction Using UPD64 High Speed Capture on the ETS-800
4:00 pm
Quick RDSon Testing Utilizing HC Trace Magnetic Coupling
4:30 pm
Networking Event
In PersonOctober 24, 2022 | UltraFLEX & IG-XL Track
8:30 am
Registration
9:15 am
Welcome
9:30 am
Teradyne Roadmap Presentation
10:30 am
Break
10:45 am
Asynchronous Parallel Test with SLT
11:15 am
Fast Throughput on the UltraFLEXplus Enabled by the PACE Architecture and Site-Aware Variables
11:45 am
Lunch
1:15 pm
Optimized Measurements for RF Functional Verification of 5G and mmWave Devices Using Signal Processing Techniques
1:45 pm
MIPI I3C: an Introduction to Testing the Evolution of the I2C Bus Standard
2:15 pm
Break
2:30 pm
PyGXL: Hints, Tips, and Best Practices
3:00 pm
Improving Multi-site Efficiency with Independent Patterns per Site
3:30 pm
Understanding the Test Challenges of SCAN Using 1149.10 and How UltraPin2200 Solves Them
4:00 pm
Code is Code and an IDE is Just a Fancy Text Editor, Right? Not Quite …
4:30 pm
Networking Event

US | San Diego CA | Qualcomm

In PersonOctober 26, 2022 | Wireless Track
8:30 am
Registration
9:00 am
Welcome
9:15 am
Teradyne Roadmap Presentation
10:00 am
Break
10:15 am
An UltraLow Phase Noise Square Wave Reference Clock Above the UltraWave24 DUT Clock Maximum Frequency on the UltraFLEX
10:45 am
Over-the-Air Testing of Radar Devices on the UltraFLEX
11:15 am
Examining mmWave Structures using Time Domain Reflectometry
11:45 am
Optimized Measurements for RF Functional Verification of 5G and mmWave Devices Using Signal Processing Techniques
12:15 pm
Lunch
1:15 pm
Real World Benchmark of an UltraWaveMX8 Noise Figure Measurement Using the Direct Method
1:45 pm
Quickly and Correctly Setting the Expected Amplitude of the Receiver for EVM test
2:15 pm
An Automated Station for Efficient, Repeatable mmWave DIB De-embedding
2:45 pm
Break
3:00 pm
Deep Data Analytics Advances Device Testing with Machine Learning
3:30 pm
Enabling UltraFLEX UltraWaveMX8 Full Two-Port S-Parameters Measurement Capability
4:00 pm
MIPI I3C: an Introduction to Testing the Evolution of the I2C Bus Standard
4:30 pm
PyGXL: Hints, Tips, and Best Practices
5:30 pm
Networking Event
In PersonOctober 26, 2022 | UltraFLEX & System Level Test Track
8:30 am
Registration
9:00 am
Welcome
9:15 am
Teradyne Roadmap Presentation
10:00 am
Break
10:15 am
Introducing Repeatable Code Sequences on the UltraFLEXplus
10:45 am
Improving Multi-site Efficiency with Independent Patterns per Site
11:15 am
Current Profiling: In a Class of Its Own
11:45 am
Alarms Reporting, Processing and Debugging on UltraFLEXplus
12:15 pm
Lunch
1:15 pm
Saving Vector Memory on the UP2200 with Functional Vector Compression
1:45 pm
Understanding the Test Challenges of SCAN Using 1149.10 and How UltraPin2200 Solves Them
2:15 pm
Keeping Devices Cool
2:45 pm
Break
3:00 pm
Pattern Compilation Multithreading
3:30 pm
An Overview of System Level Test
4:00 pm
High Protocol Scan with System Level Test
4:30 pm
Titan RF: a System Level Test Platform with Integrated LitePoint Technology
5:30 pm
Networking Event

US | Irvine CA

In PersonOctober 27, 2022 | UltraFLEX Track I
8:30 am
Registration
9:00 am
Welcome
9:15 am
Teradyne Roadmap Presentation
10:00 am
Break
10:15 am
Test Development Nirvana: Utilizing Design Files with PortBridge
10:45 am
112Gbps PAM4 and NRZ PHY Layer Testing Using Third Party Instruments
11:15 am
Fast Throughput on the UltraFLEXplus Enabled by the PACE Architecture and Site-Aware Variables
11:45 am
Deep Data Analytics Advances Device Testing with Machine Learning
12:15 pm
Lunch
1:15 pm
Introducing Repeatable Code Sequences on the UltraFLEXplus
1:45 pm
Alarms Reporting, Processing and Debugging on UltraFLEXplus
2:15 pm
Understanding UltraFLEXplus Specifications
2:45 pm
Understanding the Test Challenges of SCAN Using 1149.10 and How UltraPin2200 Solves Them
3:15 pm
Break
3:45 pm
Improving Multi-site Efficiency with Independent Patterns per Site
4:15 pm
PyGXL: Hints, Tips, and Best Practices
5:15 pm
Networking Event
In PersonOctober 27, 2022 | UltraFLEX Track II
8:30 am
Registration
9:00 am
Welcome
9:15 am
Teradyne Roadmap Presentation
10:00 am
Break
10:15 am
Test Development Nirvana: Utilizing Design Files with PortBridge
10:45 am
112Gbps PAM4 and NRZ PHY Layer Testing Using Third Party Instruments
11:15 am
Fast Throughput on the UltraFLEXplus Enabled by the PACE Architecture and Site-Aware Variables
11:45 am
Deep Data Analytics Advances Device Testing with Machine Learning
12:15 pm
Lunch
1:15 pm
Efficient Jitter Measurements of Low Frequency Asynchronous Clock Outputs on the UltraFLEX Family
1:45 pm
Pattern Compilation Multithreading
2:15 pm
Keeping Devices Cool
2:45 pm
An Introduction to Teradyne's DIB Diagnostic Tools
3:15 pm
Break
3:45 pm
Plot Tool Deep Dive
4:15 pm
Using TestInsight to Convert High Speed Scan STIL to UltraFLEX/UltraFLEXplus Patterns
4:45 pm
Current Profiling: In a Class of Its Own
5:15 pm
Networking Event
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Gallery of Past Events