Radar devices in the 60GHz V-band and 80GHz e-band are incorporating Antenna structures right on the Die. This Antenna-in Package technique is common practice and requires creative over-the Air test techniques. Simple V-band and E-band radar devices have a low antenna count. Usually two antennas: dedicated RX and TX antennas or one vertically and one horizontally polarized antenna. New Generation radar devices, however, are increasing antenna count upwards to 4 RX/4 TX arrays. This requires mm-wave muxing by the ATE MM-wave instrument to handle the increase antenna counts and increase site counts of these next generation radar devices. Low cost, high-density test solutions will be required to test these next generation radar devices in high volume production. This paper will explore low cost, high density near DUT radar test solutions that on the UltraFLEXplus.

The near DUT radar solutions incorporate the use of the UPAC500 and DSI SPI bus and User Power Supplies as some instruments used for test with the near DUT modules.