Self / 3rd-Party
Teradyne DIS

Project Details

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Up-Front Engineering Effort

DIB-diag Included
One-time labor cost for developing DIB diagnostics test code
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$
One-time labor & tester time cost for DIB-Diagnostics Debug work on tester before Bin-1 work can begin
$
$
Assumption
One-time NPI DIB debug cost before test program is ready and debugged…
$
$
Hidden cost for multiple Bin-1 runs per DIB based on manufacturing yields (includes labor rate and tester time rate)
$
$

Reliability Expectations

Average time between DIB failures, assumes better parametric fault coverage by DIB-diagnostics will result in fewer early life failures
Average time from DIB failure until DIB is returned to the production floor working

Repair Costs

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Test Quality / "Limping DIB" (site shut-down) impact on HW costs:

Throughput lost by partial site shut-down due to quality of boards
$
$

Probe Needles & Sockets Life Benefit through Intelligent Needle Clean

$
$

Self / 3rd-Party

Teradyne DIS

Difference

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Total Cost of Ownership over product life

Total Cost of Ownership over product life

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