To improve device hardware and software quality and decrease the TTM (time to market); test engineers are frequently required to develop test programs ahead of real device or related hardware being available with or without a tester. How to simulate a device and develop a high coverage test program in the condition of without a substantial DUT (Device Under Test), DIB (Device Interface Board), hardware connections or even a tester is becoming a growing challenge for almost all test engineers as well as the ATE industry.

This paper will introduce a novel method to simulate multiple complex RF SOC devices in one test program. Real hardware modules with a variety of applications have their independent software sub-program; they are the most basic blocks in this system. Through different combination of these modules, different scales and types of RF SOC devices are build up. At the same time an related integrated test program is auto generated.

To guarantee the coverage and complexity, the modules repository will include as many possible types as possible of modules ranged from: RF LNA, mixer, modulator, demodulator and so on. Each module may have its own protocols like JTAG, SPI; these can prove device interface as well. The test type in each sub-program will also cover as many possible test items.