Using some more advanced concepts on the ETS-800, the team intends to show means for saving test time on large user-based functions. The digital focus includes using dynamic storage of C++ vector maps with the waveform sheet of the DSSC to save test time when a repetitive large scale register map read is needed. Furthermore on the Analog side we will cover the advantage of using the per pin APU-32 AWG Pattern Generators to implement separate pattern based power cycling sequences for multiple supply pins. Finally we will show how we used instrument specific stat calls to create subroutines based on instrument states such that to avoid redundant API calls and thereby save test time.