DIB diagnostics is often required by customers to be implemented as part of the testing solution that Teradyne provides. One of the most common components used to configure each test into the test flow world, is the mechanical relay. Therefore, an automated way to develop diagnostics for these components will be truly helpful to reduce development time and potential human errors during this phase of the project. The paper proposes an automated method that takes the schematics of the whole test solution to generate the diagnostic code in C++ as much as possible for the mechanical relays present in the design. This tool is being used successfully in a leading power semiconductor company testing with an Eagle System. The debugging process consumed twice as much time before having this tool working. It is also deployed in a project with MOSFET devices on the ETS-88 platform helping engineers to get faster diagnostic of damaged relays