Using concurrent testing as a method to reduce test costs has been on the radar for more than a decade now. Concurrent testing can have advantages in many different applications. Some may think about doing analog or parametric tests while the internal MBIST is occupied with a longer Flash tests, testing different modules with different LBIST tests at the same time or simply testing 2 ports simultaneously. Any of these methods can reduce touchdown times or test program runs significantly.

However, in many cases so far, limitations of the device’s or the tester’s capabilities have prevented the introduction of concurrent testing. Now, the architecture and instrument features of the UltraFLEXplus like the asynchronous pattern starts and the increased ratio of patgens per instrument can make concurrent testing easier.

This presentation describes the work done to demonstrate concurrent test capabilities on the UltraFLEXplus. It will show different use cases and how they are being implemented on the UltraFLEXplus. It will also describe differences from the existing UltraFLEX instruments and the advantages of the new PACE architecture for concurrent testing.