To improve yield and test efficiency, semiconductor manufacturers seek adaptive test strategies that allow predicting the behavior of a device-under-test (DUT) based on statistical data analysis and support triggering focused testing. To provide this, test engineers need a set of pragmatic solutions to process test cell data and act on it in a way that is reliable, portable, expandable and low cost. They need the flexibility of choosing between turn-key solutions and a development platform to create customized solutions. Teradyne is introducing a new Analytic Management Platform (AMP) which provides a platform approach to data analytics by enabling development of a diverse set of portable solutions. This presentation will give an overview of the AMP platform infrastructure focusing on its real-time data processing capabilities and its general interface for streaming data and requesting actions. We will describe how the Software Development Kit for AMP can be used to analyze test cell data and to control aspects of the test cell. The AMP SDK expands upon the benefits of the Tester Events Messaging Standard (TEMS) by adding the powerful bidirectional ability required to control the test program. The custom solutions built with the AMP SDK can easily be run outside the tester host computer, either on an external server or on the new UltraEDGE computer, to avoid impacting the test time and reliability of the test cell.