System-on-Chip (SOC) device designs are becoming increasingly more complex. The connections between the multiple IP blocks are difficult to test during ATE package test without significantly increasing the overall test time. System Level Test (SLT) provides a practical, economical solution to this problem. The Titan solution is robust, but it does introduce a new programing model and user interface. Our customers have requested tools and interfaces that are similar to products that currently exist in IG-XL for the UltraFLEX family of products. We have developed platform agnostic tools and interfaces to meet this demand. These include our new High Speed Serial Scan Debug tool and support for PortBridge interfaces on Titan. These components allow us to share tests and debug environments across both systems. This enhances both platforms while reducing the overall learning curve for migrating from one system to the other.