On-Die sensors are revolutionizing system health and performance monitoring in the field as well as during ATE test. Device complexity is increasing, test program complexity is increasing and time from silicon arrival to product ramp is decreasing. Test engineers need solutions they can integrate quickly into their existing test flows that allow them to reduce debug time while improving test coverage. proteanTecs provides cloud based, technology agnostic data processing on their wide range of supported die sensors. This includes real-time decision models and uploading captured results to the cloud for cross-insertion learning. PortBridge integrates proteanTecs solutions seamlessly into IG-XL, providing a clean optimized, multi-site interface. This talk will cover customer successes in this area and new features added to further enable customer data collection and analysis.