This session presents a new native characterization method that reveals the true performance of your DUT by effectively removing the tester effect that potentially masks your results. As background, critical tests of ACLR and EVM are examples where removing these masking effects are desirable, but cumbersome to implement due to the inherent signal distribution prerequisites. Attendees already realize that every dB matters, so this session reveals this new native capability only available on UltraFLEXplus. Afterwards, attendees understand how this new tool can apply to their next new silicon ramp, with support for both characterization and production activities.