Moving test coverage upstream has long been a desire to reduce test cost and catch failures earlier in the production flow. Complex PHY protocols and the desire to run mission mode tests on the DUT make it difficult to create coverage-equal functional patterns, or traditional ATE tests from SLT coverage. The new Teradyne UltraPort-PCIe and UltraPort-USB instruments allow the user to run high protocol scan while also providing a Linux environment where the user can natively run apps and scripts to exercise the PHY and the DUT in an SLT like environment on the UltraFLEXplus. Adding native PCIe and USB to your ATE test flow can enable failures to be caught as early as wafer sort, allowing failures to be fed back to the fab earlier and saving the cost of building the die into a packaged part and additional insertions.