In order to meet various test requirements, the number of test items for larger SoC device is increasing day by day. To analyze the results of test items, it is needed different binning methods to find the test results of the test items in efficiency for specific test items. There are many methodologies to accomplish binning in tested result, and using limit set is a one of faster and flexible method in IG-XL. Limit set can carry out multiple binning requirements application, such as normal usage of binning which stops the testing immediately when the test item is failure. The other binning methods, the binning result of the test will be judged after a numbers of test items to expected bin. In another word, the test result is sorted by specific group instances or block with the failed items. In addition, it is also able to manage suppress binning application for developing, debugging and production requirements. Limit set is an existing feature in IG-XL to support and maintain the diverse binning function for test engineers and production engineers prosperously.