An Innovative Solution for Fully Testing High Speed Serial Interfaces to 112Gbps and Beyond | Teradyne

This paper will present and describe the newest member of the UltraPHY high speed interface test solution family and demonstrate its use not just for the highest speed SERDES interfaces but also how it could be applied to many other multi-level and encoded signaling busses. It is a fully integrated testhead instrument applying a DAC based super high speed arbitrary waveform generator as a pattern and signal generator. It is paired with a super high bandwidth ADC based digitizer to capture and analyze almost any kind of data signal. Examples of SERDES, PAMx, MIPI camera C-PHY, MIPI automotive A-PHY, DP-QPSK coherent, and other test signals will be sourced and captured. Innovative features like a live PRBS pat gen driving a DAC, super low jitter performance, and system coherent clocking will be discussed and described.