Dynamic Part Average Testing (DPAT) is a key tool for identifying outliers in manufacturing processes, enhancing production quality. Although typically implemented at the wafer stage, it’s also applicable in Final Testing. At the wafer stage, DPAT can be executed inline, coded, or applied as a post-process before wafer cutting. In Final Testing, inline execution of DPAT is necessary due to the absence of further sorting. Despite the demand for a general solution or methodology for incorporating DPAT, Teradyne currently doesn’t provide one yet, as each customer has unique requirements. This paper explores the benefits of a comprehensive Teradyne solution for DPAT testing on the ETS-800. The proposed solution involves developing a Teradyne DPAT library, which would enable customers to conserve time, minimize effort, and enhance quality while minimizing the changes required to each test application. The primary objectives include standardizing inputs and outputs, simplifying user coding, and improving DPAT solutions’ test time. This approach allows users to have the flexibility to customize their calculations, promoting efficiency and precision in DPAT testing.