The massive increase in people working from home, and demand in xEVs has accelerated the adoption of wide-bandgap semiconductors in consumer and automotive products, introducing new testing requirements to the discrete transistor and power module focused markets. In some cases, these tests are critical to evaluating the underlying process and ensuring that a device is functional. In other cases, the test challenges are an expansion of efforts already in place with IGBTs and high voltage MOSFETs.
Tom Tran, Product Manager for Power Discrete Test Products at Teradyne, presents an overview of the challenges of wide-bandgap device testing, and strategies for addressing them.
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