Teradyne - Semiconductor Test Division

Semiconductor Test is a lead-ing supplier of semiconductor test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as System-On-a-Chip (SOC) or System-In-Package (SIP) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.

IP750EP

IP750Ex - Providing the Best Test Economics

The world standard for image sensor testing continues to evolve

If you are looking for a reliable image sensor test solution, contact Teradyne to find out what the cost effective IP750Ex can offer.

 

IP750Ex Features:

High Throughput

  • Dual core DSP with high speed data transfer at 10Gbps per instrument parallel
  • Up to 32 sites in parallel test with 1024 digital pin configuration
  • The highest parallelism in production today ensures the highest throughput

Broad Device Coverage - up to 32M Pixels

  • High versatility for testing broad range of devices – VGA to 32M pixels with SMIA LVDS test capability using ICUL
  • The only instrument solution in the market with more LVDS protocol coverage roadmap on the horizon
  • Strong SOC test capability with brand new HSD200 digital instrument for SOC type image sensor

Single Platform

  • Built with Teradyne’s J750 test platform (over 2,800 systems installed worldwide)
  • IP750 series can be upgraded on-site to IP750Ex to better utilize valuable assets under rapidly changing market environment

Test Program Compatibility

  • IP750EP/EMP test program can run on IP750Ex with minor conversion

IG-XL Software: Fast Program Development with Common System Software Environment

  • Built using Windows® Excel which provides a user-friendly interface for fast program development
  • Enables easy upgrade of test programs from single to multi-site, dramatically reducing the workload of test engineers on mass production launches.
  • Common software environment for the IP750 family, the J750, and the FLEX family, eliminating the need for training test engineers for software programming on separate testers

IP750/IDP Library

  • Utilizing an IDP (Image Data Processing) library with a wide range of data processing techniques developed by the IP750 - making test programming easier than ever before

High Reliability with Worldwide Support

  • Teradyne Japan Business Unit developed the IP750 Series based on the highly reliable J750 test platform
  • For over 20 years, Teradyne has ensured its customers high quality performance and worldwide support based on its experience in research and development, manufacturing, and customer support, and its expertise with image sensor testing