Magnum VUy for NAND Protocol Test Enhancement

Ultra-High Performance NAND Protocol Test Enhancement to Magnum V Platform

Teradyne’s Magnum VUy system is a flexible, superset test platform for all NAND and MCP products, both cutting edge UFS 4.1, uMCP, and PCIe Gen 5 mobile and automotive devices, as well as ONFI and Toggle NAND, and legacy MCP’s such as UFS 3.1, PCIe Gen 4, e.MMC, and eMCP.’

Protocol NAND

Advantages

Flexible

Magnum VU is a flexible, superset test platform that uniquely covers all NAND test, including protocol test of next generation mobile and automotive devices UFS4.1 and PCIe Gen 5, and also the previous generation of mobile devices UFS3.1, PCI Gen 4. It can also test e.MMC, as well as ONFI, Toggle, and raw NAND for solid state drives (SSD). This flexibility provides the lowest risk investment for all next generation NAND test capacity and engineering.

Scalable

Magnum VU is a scalable test platform built for longevity. In order to leverage our customer’s investments in our test platform, Teradyne designed the Universal Protocol Board to be easily upgradable. The original UPB has now been followed by UPBx and UPBy, and when the next technology comes UPBz.

Highest Performance and Highest Throughput

Magnum VUy is a high performance, high throughput test platform. Using Teradyne technology to miniaturize the UPBy instrument, Teradyne radically changed the test paradigm, completely eliminating the traditional cabling between the test instrument and device under test (DUT), and directly docking the UPBy to the socket boards. This architecture, called near DUT test (NDT), dramatically shortens the signal path, increases performance, reduces latency, and most closely emulates the real system environment.

Applications

  • UFS4.1 & UFS3.1
  • NVMe and custom protocols
  • PCIe Gen5 and Gen4
  • eMMC
  • Toggle NAND
  • Legacy NAND
  • ONFI FLASH
  • MCP
  • eMCP
  • uMCP

Configurations

Magnum VU EV

  • Self-contained, engineering test system for test program development and device debug
  • Configurable up to 16 UPBy to test 64 UFS4.1 or PCIe Gen 5 devices (1-2 lanes)
  • 100% compatible electronics, software, DSAs, cal and diags with Magnum VU SSV and GV production systems

Magnum VU SSV

  • For high volume, production final test applications
  • Configurable up to 128 UPBy to test 512 UFS4.1 or PCIe Gen 5 devices (1-2 lanes)
  • Integrated with Teradyne Vertical Plane Manipulator for efficient docking to industry standard device handlers

Magnum VU GV

  • For highest volume, production final test applications
  • Configurable up to 192 UPBy to test 768 UFS4.1 or PCIe Gen 5 devices (1-2 lanes)
  • Integrated with Teradyne Vertical Plane Manipulator for efficient docking to industry standard device handlers