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Automotive
Power
3 for 3: Testing High Power Discrete Devices
Emerging markets are driving the evolution of discrete power devices. Increased power requirements mean more power is being driven through a smaller device, creating challenges in both ...
3 for 3
Tools
3 for 3: PortBridge: Simplifying the Path from Design to Test
Teradyne’s PortBridge facilitates a streamlined flow of information from bench to automated test equipment (ATE), enabling design and bench engineers to communicate directly with ...
Image Sensors
Image Sensors Are Everywhere and the Implications for Test Are Significant
In February of 2021, the NASA Perseverance rover actively navigated a fully-autonomous entry and descent to successfully land in the Jezero Crater on Mars, using a brand-new navigationa...
Compute
Advanced Digital Process Nodes Drive Semiconductor Test Innovations
Global internet traffic is growing exponentially, with no sign of slowing, and this demand is driving the evolution of the semiconductor industry. The appetite for more and more ...
Wireless
The 5G mmWave Commercialization Effort Is Underway
Millimeter Waves for 5G 5G broadband cellular technology entered its first major rollout phase in 2019. In recent years, 5G adoption has been very visible among the consumer electronics...
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System Level Test
3 for 3: System Level Test
System level test (SLT) adoption is being driven by the increasingly challenging interplay between growing device complexity and tighter end-customer quality requirements. In Teradyne&#...
System Level Test
Emerging Technologies Are Driving System Level Test Adoption
With the size of semiconductor transistors decreasing and chip complexity increasing exponentially, semiconductor test has become essential to ensuring that only high-quality products g...
Tools
Ensuring Your Semiconductor Test Equipment Is Protected from Rising Cybersecurity Threats
Cybersecurity threats pose risks to your business everyday and can attack every aspect of your operation, and these threats are only increasing. According to IBM Security’s Cost of a ...
Tools
Teradyne’s PortBridge: Simplifying the Path from Design to Test
The Path to Test Getting an integrated circuit (IC) from design to test is an arduous process that encompasses a number of steps, including: Design for Test (DFT): process...
Wi-Fi
Wireless
The Future of Connectivity Is Higher Data Rates and Micro-positioning
These days, we tend to take global wireless connectivity for granted. Whether we’re in a coffee shop, a hotel room or a plane at 35,000 feet, chances are that we’ll be able ...