Test System Optimized for High Volume Production Testing of Integrated Circuits
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture.
Enabled by patented SmartPin® Technology, and floating architecture, the ETS-364 provides pattern-based test capabilities limited only by the speed of your latest semiconductor products, offering users superior parallel test capability.
Offers excellent economics and delivers broad device coverage and a large potential customer base for OSATs.
ETS-364 gives users the unprecedented ability to scale their test platform within the ETS Test Family to match their throughput demands.
- Power Management
- Battery management devices
- Consumer audio
- LED drivers
- Data converters
- Temperature sensors, fan speed controllers, smoke detectors
- Disk drive, sense amps and servo controllers
- Automotive devices
- BUSS devices
- Amplifiers (high precision, high speed)
- Precision voltage references
The innovative EV programming environment optimizes programming efficiency and instrument flexibility to support single site, multisite and bridged applications, all from a common platform.
The ETS-364 system can support:
- Up to 240 analog channels
- Up to 128 digital channels
Platform scalability is key in the semiconductor test market, and ETS-364 system uses the same floating analog resources as the ETS-88 product family.
8×8 MATRIX: high voltage force / sense crosspoint matrix; any input channel can be connected to any output channel
CAMII: instrument module designed to measure capacitance in the sub picofarad range
HCMFB: 16 separate 1×4 solid-state force / sense matrices programmed with a single software command
QHSU: two fully independent dual channel high-speed signal analyzers capable of source or measure up to 50 MHz
WCU-2220: waveform capture instrument with full scale sensitivity from 0.2V to 2000V at 8-bit resolution with a decade of programmable offset available per range
QTMU: 4+ direct input time measurement units multiplexed to digital pins with a start/stop and arm signal per sequencer. Capable of voltage swings up to +/- 50V.
11×16 MATRIX: medium voltage force / sense crosspoint matrix; any input channel can be connected to any output channel with a single software command
DPU-16: 16 digital I/O channels supporting vector rates up to 132 MHz with 8M of standard vector memory
HPU-100: single channel V/I with 10 current ranges operating up to +/-100 A
QMS / QMS-T: four precision (12-bit at 10 Msps or 16-bit at 200 ksps) independent floating differential volt meters that support AC and DC measurements up to +/-200 V
SPEC Cage: test head expansion, relocating high power instruments to the mainframe cabinet
APU-12: 12 channel, four quadrant V/I with six current ranges ranging from 200 mA to 10 uA at +/-30 V
MPU-120: four quadrants V/I with built in 16-bit digitizer capable of forcing voltage up to 120 V and current force up to 40 Amps
QPLU: low noise, analog source and measure resource with 1 PPM (20 bit) accuracy with 381nV resolution
SPU Family (112, 500): a suite of V/I’s capable of addressing a wide range of test requirements ranging from 100V / 2A to 500V / 50mA with fully AWG and digitizing capabilities per channel. SPU-112 is capable of up to 12A pulses when paired with the booster board.
PAM: Pico Amp Module, suitable for sub nA and pA current measurement
The EV software suite is a robust test development environment, elevating applications program development and debug to new heights. Every ETS test system is controlled via PC, running a standard Microsoft® operating system and using Microsoft® .NET C/C++ development tools for code creation. ETS’s software tools are easy to learn, easy to use and are fully integrated into the Microsoft® Visual Studio® development environment.
A suite of automatic code generation tools supports the complete test system command set, providing users with the program control they need without forcing them to memorize coding syntax. Wizard tools are available for creating tests, editing test limits, and changing the test execution flow. Graphical plotting tools are provided for simple point-and-click plotting of test-oriented waveforms. The eRAIDE debug environment makes it easy to view and change tester hardware settings. A robust help file system navigates users through the tool set and provides coding examples, further reducing development time.
As the leading provider of complete Test Cell Solutions and services, we at Teradyne leverage our expertise, experience, and technology leadership to help our customers achieve the highest yield and the highest throughput in production with the fastest time to market. We partner with you in your journey from design to production to provide standard and customized test cell products and services.