Next-Gen Automotive Test Platform With the Industry’s Highest Throughput and Fastest Time to Market
Semiconductor Content Is Increasing in Cars
There are more devices being designed into our cars requiring critical device test. Current automotive market trends include an increase in semiconductor content such as ADAS, HEV/EV and cluster displays/infotainment. Hybrid (HEV) designs are driving high voltage semiconductor content. Automotive device manufacturers are presented with new test challenges and the pressure of getting new products to market faster while improving quality and reducing costs.
What are some of the test challenges under competing pressure to decrease cost of test and speed time to market? Automotive device manufacturers are faced with increasingly complex multisite Device Interface Boards (DIBs), complex test planning, long test program development time and the challenge of applying test techniques to reduce multisite overhead test time. All of these test challenges are under the same competing force of speeding up time to market while driving down test costs.
Teradyne’s automotive test customers count on us to provide the solutions to meet their market demands. The ETS-800 provides high automotive-level test quality. It is designed to remove the road block of DIB complexity enabling higher site count. Our automotive test system reduces time from project start to release to production. And, the ETS-800 enables a sustainable high throughput with a high site count production solution.
The ETS-800 is designed with comprehensive functional test coverage including extensive analog and digital capability. It can be configured in single, dual and quad sector configurations. The system includes a floating analog architecture, VI sequencing, four high speed instrument buses based on 2.5 GHz PCI express and Teradyne’s unique alarm infrastructure for high quality.
High Throughput Production Solution
The ETS-800 has a unique combination of solutions that address the challenges of complex automotive test. It features Multi-Sector Technology (MST) which is a quad sector with multi-core test controller design for ultra-high parallel test efficiency. Eagle Vision MST software delivers the system architecture’s high throughput while providing a powerful yet easy to learn development environment. Engineering efficiency for developing DIB’s supporting multi-site test with the MST architecture is significantly improved because of the Adaptive Pin Expansion (APEX) capability removing most of the relays from the DIB that used to be required on previous test systems to switch instruments to different device pins.
Here’s Why Parallel Test Efficiency Matters
Parallel test efficiency has a significant impact on throughput at a higher site count. Let’s use a PMIC device tested on the ETS-800 as an example. If the parallel test efficiency is increased from 95% to 99% while testing eight devices in parallel the units per hour or throughput is increased by 26%. If that same device is tested with 16 devices in parallel with parallel test efficiency increased from 95% to 99% the throughput is increased by 52%. This is an important equation to any manufacturer examining their process with the goal of reducing costs, but not compromising quality. That’s why for the best parallel test efficiency, automotive device manufacturers turn to Teradyne.
How We Deliver Repeatable Quality
Automotive technologies need to work under a wide spectrum of environmental conditions. This unique requirement extends the operating ranges of systems and electronics into areas far beyond consumer products. With the growing number of electronic subsystems in a car, the opportunity for malfunction is rising exponentially. This puts significant pressure on the reliability of automotive built-in electronics and drives strict semiconductor test requirements.
The main goal of testing is to screen out faulty devices (faulty with respect to its specification). Test intensity which includes longer test lists and more test insertions at multiple temperatures is increasing for automotive devices in order to verify every integrated block or function. A target of zero defects leaves no chance for gaps.
A key ETS-800 enabler to achieving highest test quality is Teradyne’s SmartPin3 technology. SmartPin3 provides floating DC test capability while enabling glitch-free transitions and prevention of electrical overstress.
The Importance of Alarms to Improve Test Quality
Alarms are a tester feature that trigger a notification if an instrument cannot satisfy its programmed condition. Whenever an instrument is unable to perform its programmed function, the tester software will force the device under test to fail as the default behavior.
Why Teradyne’s Integrated Alarms Make a Difference
Integrated instrument alarms on the ETS-800 ensure that the correct stimulus is applied during testing without requiring the user to add extra hardware or software checks to the test application. Alarms let the test engineer focus on the DUT and test list and not on any extra effort that otherwise would be needed to ensure the test setup. This leads to greater engineering efficiency, faster test times, less overhead circuitry on the DIB and therefore optimum throughput.
Alarms are a critical function of an automotive test system. They enable the correct test setup has been applied without any user intervention. For the strict requirements in the automotive market, alarms are an essential tool to achieve the required quality levels.
To ensure that you can produce the highest quality automotive electronics at reduced cost and engineering development time, Teradyne’s ETS-800 test system is the best solution.
The ETS-800 Test Platform is designed with a unique Multi-Sector Architecture whereby the system is inherently scalable in terms of site count up to 1024 total sites. The system supports up to four sectors which are typically configured in a symmetrical fashion. Each sector represents a complete mixed-signal multisite test system capable of testing a wide variety of products. Systems are controlled via a single multi-core test computer and may be populated with one, two, or four sectors based on the desired maximum site count.